SINGAPORE, May 21 (Bernama-GLOBE NEWSWIRE) — Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies.
By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR IME’s cutting-edge semiconductor research, the partnership will accelerate the development of advanced metrology solutions that enable efficient AI chip production.